Tags

Tags give the ability to mark specific points in history as being important

N6Y250-14A3-test

02908f57 · Fixed tuning value for LDAC_LIN · Jul 06, 2022
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Software version used to test wafer 14A3 from batch N6Y250
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N6Y250-15H1-test

06e14c98 · Temperature calibration fix · Jul 05, 2022
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Software version used to test wafer 15H1 from batch N6Y250
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N6Y250-07D4-test

53ac0035 · Increased size of green region for digital chip bottom current for 07D4 · Mar 18, 2022
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Software version used to test wafer 07D4 from batch N6Y250
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N6Y250-08C7-test

e10d2ba4 · Added check on 0 A current at startup · Mar 16, 2022
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Software version used to test wafer 08C7 from batch N6Y250
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N6Y250-09C2-test

edf82fb3 · Improved probe station movements · Mar 15, 2022
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Software version used to test wafer 09C2 from batch N6Y250
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N6Y250-10C7-test

93e0c769 · Added ground subtraction to V_BGR measurement · Mar 14, 2022
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Software version used to test wafer 10C7 from batch N6Y250
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N6Y250-11C2-test

105e991a · Fixup for removal of V_BGR · Mar 10, 2022
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Software version used to test wafer 11C2 from batch N6Y250
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N6Y250-12B5-test

2a963d95 · Fixed mux names after DAQ update · Mar 08, 2022
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Software version used to test wafer 12B5 from batch N6Y250
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N6Y250-13B0-test

e77abeb0 · Lowered high contact resistance threshold (35 milliohm) in LDO mode · Mar 03, 2022
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Software version used to test wafer 13B0 from batch N6Y250
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N6Y250-04F3-test

f50ec7ed · Merge branch 'visualisation' into 'development' · Feb 10, 2022
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Software version used to test wafer 04F3 from batch N6Y250
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N6Y250-06E1-test

87342af1 · Increased timeouts for threshold equalization and temperature measurements · Mar 01, 2022
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Software version used to test wafer 06E1 from batch N6Y250
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