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Fix bugs of SCT_MonitorConditionsTool (ATLASRECTS-5285)

Susumu Oda requested to merge oda/athena:master-ATLASRECTS-5285 into master

Before updating redundant string operation of SCT_MonitorConditionsTool, I noticed several bugs of SCT_MonitorConditionsTool and fix them.

  • nBlock method has counted the number of strips with defects around an interested strip. This is meaningless for noisy wafer and chip determination. We need to define a interested range of 128 strips for chip and 768 strips for wafer. This is fixed.
  • To do this, the chipLevel variable was added to the nBlock and nDefect methods.
  • If a single strip with defect in the interested range, the number of strips with defects should be 1 instead of 0.
  • theNumber was not clear and was changed to theStripNumber.
  • Define SCT_ConditionsData::STRIPS_PER_CHIP and use it in SCT_MonitorConditionsTool.
  • Use SCT_ConditionsData::STRIPS_PER_WAFER in SCT_MonitorConditionsTool.

RunTier0Tests.py was fine. RunTier0Tests.log

Edited by Susumu Oda

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