Use case: channel loss monitoring
The S-curves allow extracting the noise of a given VFAT channel. When a VFAT channel is damaged after a propagating discharge, its noise level changes significantly, it either drops close to 0 fC or increases. One must be able to detect changes in noise across runs and automatically detect input channel damages.
Typically, a S-curve scan is taken daily and compared with the one from the previous
n days. Then, summary plots are provided for extend periods of time that can span over years.
What is the expected correct behavior?
It must be possible to automatically compare the noise levels between S-curves and detect damaged channels. The evolution of the number of dead channels over long periods of time must be easily accessible to the end user.