Scan routine for detecting broken S-bit lines

Description

Watching by eye the S-bit scans result to see which VFATs might have broken S-bit lines is time-consuming and error-prone. A dedicated routine would be desired to replace the script currently available to check the broken S-bit lines for a given oh.

Note: at the beginning of the routine, the masked S-bit lines from the OH config files should be unmasked.

The implementation can be staged in 2 parts.

1. the creation of a new scan type and interface on the calibration suite
2. the implementation of the routine as an rpc function, paying attention to the possible transaction failures due to instability and related masking.