Chipid redundancy

See merge request !25

Szymon Kulis authored Nov 02, 2022 and Stefan Biereigel committed Nov 02, 2022

This commit implements the chosen redundancy approach for the chip ID stored in the eFuses. eFuses in production devices are stored five times, each copy rotated by 6 bits, to alleviate single-bit unreliability during the fusing process. Additionally, the stored 32 bit value is protected using a SECDET hamming code. The `get_chipid_X` methods now perform majority voting over these multiple copies and error detection/correction, in order to return the most reliable estimate of the true chip ID.

Since pre-series devices were delivered with only one chip ID stored, the majority voting stage is skipped when such a device is detected.

Added possibility to set max,min,range for XY during EOM scan. This is to fix the fact that the latency between the sampling 2G65 EOM clock and the base 40M clock is not fixed by design

Added eom_end_of_count_sel as argument for EOM measurements

See merge request !23

add register-related constants

Closes #10

See merge request !20

Resolve: #11

Closes #11

See merge request !22

Fix input validation in fuses_burn_bank

See merge request !21

Generalize fuses_burn_bank

See merge request !19

Resolve: Send 16 bytes address and data command

Closes #8

See merge request !18

I2c master transaction counter

See merge request !16

Add helper methods to operate on cap bank in CLKG

See merge request !15