changes for PB QC procedure
A few changes:
- Cleaned up and speed up testing programs: remove Vin scan, reduce LV and HV measurement points in efficiency scan and HV scan, reduce the number of measurements in CUR1V and CUR10V scan.
- Adjust temperature ranges and thresholds for cold tests.
- Add a PB burn-in program: inputs are the DCDC load and burn-in time.
- Fix a bug in PTAT temperature conversion (was using FEAST slope)
See temperature distributions in cold tests below
Edited by Zhicai Zhang