Cleaned up and speed up testing programs: remove Vin scan, reduce LV and HV measurement points in efficiency scan and HV scan, reduce the number of measurements in CUR1V and CUR10V scan.
Adjust temperature ranges and thresholds for cold tests.
Add a PB burn-in program: inputs are the DCDC load and burn-in time.
Fix a bug in PTAT temperature conversion (was using FEAST slope)