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Fail PADID scan if there is an issue with setting the OF

Ben Bruers requested to merge bbrueers/powertools:failPADIDIfOFIssue into activeTB

Following Karol's comment in !161 (merged), a test should fail if the OF could not be toggled. This could e.g. be the case if the second AMAC of an end-cap R3 powerboard could not be initialised. In that case the setOFin function returns false.

In the PADID scan, the setOFin function is used to powercycle the AMAC before and after scanning for the PADID. This MR catches the return value of setOFin and makes the test fail if the function returned false.

Relies on !161 (merged)

Edited by Ben Bruers

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