ENH: Add SEU test

This MR adds a continuous test for SEU (or otherwise) induced bitflips. The amount of errors for each iteration, as well as the integrated amount of errors is plotted after the scan has finished. The test can either be run indefinitely by setting scan_timeout to False, or a timeout period can be configured. The scan interval can be configured. A correct_errors flag decides whether the default configuration of the registers should be reset after a bitflip occurred or not. A generic function was added to plotting to plot a 1-dimensional data set versus timestamps.