This Mr implements a subsampling of individual charge carrier steps in case a strong electric field gradient is found. The edge position within the step is calculated using an efficient binary search with nanometer step width.
The calculated fraction of the step propagated in the high-field region is then sued to scale the step length used to calculate the local gain factors. Here, the higher of the two field values (pre- or post- step) is then taken, making this a more precise estimate both for steps into but also out of the gain region.
There are a few open questions and items to address:
P.S.: MR 1000