Use case: noise comparison
Optimizing the detector configuration to reduce the electronics noise is crucial to maximize the detection efficency. If the S-curves can be used to extract the electronics noise of a given VFAT channel, we need a tool that allows to compare different configurations. The comparison must be doable for
n chambers with
m sets of S-curves.
For instance, in the legacy software, the following comparison plots can be produced for every chamber.
What is the expected correct behavior?
It must be possible to compare S-curves (but probably also other scans, such as S-bit rate scans). For convenience, it should be possible to assosciate one (or more) symbolic name to every run (i.e. dataset).