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Do not mask automatically VFAT on CRC errors

Laurent Petre requested to merge feature/relaxed-masking-criteria into main

Description

From the commit message:

The first implementation of the automatic VFAT masking was quite stringent in order to remove most of the problems during data taking.

It is time to relax the requirements to more reasonable levels where only the unsynchronized VFAT are masked dynamically during data taking.

Related Issue

How Has This Been Tested?

Tested successfully during data taking up to tens of kHz on the Phase-II test beam. Pending high rate long duration tests at p5 on GE1/1...

Types of changes

  • Bug fix (non-breaking change which fixes an issue)
  • New feature (non-breaking change which adds functionality)
  • Breaking change (fix or feature that would cause existing functionality to change)

Checklist:

  • My code follows the code style of this project.
  • My change requires a change to the documentation.
  • I have updated the documentation accordingly.
  • I have read the CONTRIBUTING document.
  • I have added tests to cover my changes.
  • All new and existing tests passed.
Edited by Laurent Petre

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