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Added LDO digital scan and yield percentage

Nazar Bartosik requested to merge visualisation into development
  • Added yield in [%] to the wafer maps
  • Added digital-scan plots in LDO (not yet included in DB output)
  • Fixed bug in the DB reader script

@migrippo please check if this includes all the plots you wanted to add

Edited by Nazar Bartosik

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