Tags

Tags give the ability to mark specific points in history as being important

v1.5.6

a830ec3c · Bumped version to v1.5.6 · Jun 10, 2025

Release: v1.5.6
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Code version with support for last three production lots
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v1.5.5

cf8708a0 · Bumped version to v1.5.5 · Apr 28, 2025

Release: v1.5.5
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Update with cut tuning for process variations
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v1.5.4

009fed39 · Bumped version to v1.5.4 · Mar 06, 2025

Release: v1.5.4
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Minor testing improvements
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v1.5.3

b1357b2a · Bumped version to v1.5.3 · Feb 20, 2025

Release: v1.5.3
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Update for January 2025 wafers
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v1.5.2

5531e949 · Version v1.5.2 · Jan 27, 2025

Release: v1.5.2
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Initial version for January 2025 wafers
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v1.5.1

2845a34d · Added check on enabled tests when running wafer testing code · Dec 09, 2024

Release: v1.5.1
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Testing and analysis improvements
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v1.5.0

1d2d13c3 · Preliminary version bump to v1.5.0 · Nov 25, 2024

Release: v1.5.0
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Stability improvements and other fixes after batch NC2U91
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v1.4.3

bd25ad1f · Minor cut revisions after feedback · Sep 30, 2024

Release: v1.4.3

Release with analysis updates for batches NC2U86 and NC2U87

Enabled ToT/latency analysis, soft errors check and VMUX/IMUX check

v1.4.1

13e32816 · Bumped code to version 1.4.1 · Jul 24, 2024

Release: v1.4.1
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Small analysis patch for batch NC2U86
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v1.4.0

e241b697 · Added batch NC2U91 · Jul 23, 2024

Release: v1.4.0
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First code version for batch NC2U86
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v1.2.1

82282e39 · Merge branch 'fix-low-prio-plots' into 'development' · May 27, 2024
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Small improvements for batch NC0W14
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v1.2.0

341eee3a · Adjusted noise st. dev. cuts to match increase in analogue injections · May 24, 2024
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Code version used for the first production batch (NC0W14)
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v1.1.0

93c20d38 · Removed lanes test from v9 analysis configuration · Mar 19, 2024

Release: v1.1.0
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Release used for testing the engineering run wafers for Advafab
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v1.0.0

29d5d63f · Updated CROCv1 cuts for multilane readout · Feb 16, 2024

Release: v1.0.0
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Release for the testing of CROCv2 engineering run
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N6Y250-14A3-test

02908f57 · Fixed tuning value for LDAC_LIN · Jul 06, 2022
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Software version used to test wafer 14A3 from batch N6Y250
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N6Y250-15H1-test

06e14c98 · Temperature calibration fix · Jul 05, 2022
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Software version used to test wafer 15H1 from batch N6Y250
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N6Y250-07D4-test

53ac0035 · Increased size of green region for digital chip bottom current for 07D4 · Mar 18, 2022
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Software version used to test wafer 07D4 from batch N6Y250
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N6Y250-08C7-test

e10d2ba4 · Added check on 0 A current at startup · Mar 16, 2022
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Software version used to test wafer 08C7 from batch N6Y250
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N6Y250-09C2-test

edf82fb3 · Improved probe station movements · Mar 15, 2022
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Software version used to test wafer 09C2 from batch N6Y250
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N6Y250-10C7-test

93e0c769 · Added ground subtraction to V_BGR measurement · Mar 14, 2022
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Software version used to test wafer 10C7 from batch N6Y250
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