Incomplete module support

With !235 (merged) most of the scans can be used in a multi-chip configuration. However it is still not possible to get useful results out of some of the scans when trying to scan multiple chips / a module instead of just one chip. In particular, some scans would have to be implemented to read the data in parallel in order to get useful results.

New features / changed scans that are needed for full module support:

• Adapt scans using HitOr/TLU/TDC for multiple chips/modules:
  • HitorCalib
  • ExtTriggerScan
  • SourceScan
  • TuneTlu
• Adapt scans using sensor bias / periphery for multiple chips/modules:
  • SensorIVScan

There are also some new bugs introduced by !235 (merged) that should be fixed:

• Dumping chip status dumps only readout status of rx0 for every chip
• Fix generally broken scans:
  • Meta scans in 'measurements/'
  • EUDAQ scan
• Scans to be stopped by a KeyboardInterrupt after some time may not be useful if serial (?):
  • SEUTest

!280 (merged) should fix all this and finally add complete module support.