Draft: Merging Beam Test changes

Multiple bug fixes and new features added during the beam test.

EB:

• Proper handling of the flushes sent by the PCIe40
• Adding monitoring and debug counters
• Handling of incomplete events and discard corrupted data
• New MFP format
• Support for multiple ODIN stream
• Generation of test patterns and ODIN bank in MFP_Generator
• Refactoring of the MFP and MEP libraries
• Adding everything to the EB namespace
• Compiler warnings removal (partial)
• Various other fixes

IB:

• Fix issues with the unique wr_id
• Compiler warnings removal (partial)

For more details see the individual commits in this MR