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Draft: Merging Beam Test changes

Flavio Pisani requested to merge fpisani_eb_dev into master

Multiple bug fixes and new features added during the beam test.


  • Proper handling of the flushes sent by the PCIe40
  • Adding monitoring and debug counters
  • Handling of incomplete events and discard corrupted data
  • New MFP format
  • Support for multiple ODIN stream
  • Generation of test patterns and ODIN bank in MFP_Generator
  • Refactoring of the MFP and MEP libraries
  • Adding everything to the EB namespace
  • Compiler warnings removal (partial)
  • Various other fixes


  • Fix issues with the unique wr_id
  • Compiler warnings removal (partial)

For more details see the individual commits in this MR

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